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All-Purpose Nanoscale
X-Ray Inspection System
MUX-2021
X-Ray Inspection System
MUX-2021
Description：
- In-house X-ray source boasting the highest resolution in the world
- Equipped (JIMA chart 0.4 μm guaranteed)
- Spatial resolution 100 nm or less
- High-precision rotating sample stage adopted
- For Semi-conductor, Fine electric devices, Materials, Chemistry, Medical, Biological observation and analysis.