1 /
1
All-Purpose Nanoscale
X-Ray Inspection System
TUX-3300N
X-Ray Inspection System
TUX-3300N
Description：
• High Resolution 0.4um resolution and boasts high magnification with 1200x geometric
magnification and 7200x monitor magnification.
• Low-aberration nano-focus technology produces excellent resolution results.
• Our original X-ray source can be realize 0.4um resolution which is guaranteed by
JIMA-Chart*.
• For semi-conductor, fine electric devices observation and analysis.
• Besides you can use as inspection system with high-speed table operation and our original
image processing software.• Features a stage that can handle large boards.
• The system uses a-400mm diameter turntable, making it possible to perform inspections on
large boards and 300mm wafers.
• Samples can be inspected from any angle.
• Supported Heating & CT Function.
More......